Releases/
May 2025

Patterns – Custom Field & Value Rules for Smarter Testing

With Patterns, you tailor Aptori’s testing to your data model—generate the right inputs and sniff out leaks that generic scanners miss.

Patterns – Custom Field & Value Rules for Smarter Testing

Description:
Patterns (formerly known as Generator Sets) enable teams to personalize and enhance Aptori’s testing engine by defining custom rules for field names and values. These reusable patterns improve test coverage, enable realistic synthetic data generation, and power precise data-leak detection—all tailored to your application’s data model.

With Patterns, you can simulate sensitive data inputs like SSNs, credit cards, or email addresses and search for their unintended exposure in responses or stored content—uncovering flaws that generic scanners often miss.

Key Capabilities:

  • Custom Pattern Library
    Define reusable patterns for common fields (e.g., SSNs, credit cards, email addresses) and values.
  • Synthetic Data Generation
    During scans, Aptori uses your patterns to generate realistic test inputs—uncovering logic flaws and edge cases.
  • Data-Leak Hunting
    Leverage the same patterns to scan responses and stored data for potential exposures.
  • Plug-and-Play
    Manage your Patterns in a single UI; changes take effect immediately across all scans.

Where to Find It:

Manage Patterns from the Manage → Patterns section in the Aptori UI. Patterns can be applied across projects and environments.

Who Can Use It:

Available to users with "Owner" permissions.

Why It Matters:

“With Patterns, you tailor Aptori’s testing to your data model—generate the right inputs and sniff out leaks that generic scanners miss.”